An overview of scanning near-field optical microscopy in characterization of nano-materials

International Journal of Nano Dimension

مقاله 2، دوره 5، Issue 3، مهر 2014، صفحه 203-212   

نوع مقاله: Review

شناسه دیجیتال (DOI): 10.7508/ijnd.2014.03.001

نویسندگان

Z. Sobat¹؛ S. Sadegh Hassani^{* 2}

¹Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran.

²Catalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: 1485733111, Tehran, Iran.

چکیده

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.

کلیدواژه‌ها

Scanning Near-Field Optical Microscopy؛ Scanning probe microscope؛ Nano structures؛ Optical microscopy؛ Aperture less SNOM؛ Photon scanning tunneling microscopy؛ Optical fiber