Determination of porous Silicon thermal conductivity using the “Mirage effect” method

International Journal of Nano Dimension

مقاله 9، دوره 5، Issue 3، مهر 2014، صفحه 267-272   

نوع مقاله: Reasearch Paper

شناسه دیجیتال (DOI): 10.7508/ijnd.2014.03.008

نویسندگان

F. Alfeel^* ؛ F. Awad؛ F. Qamar

Department of Physics, Science Faculty, Damascus University, Syria.

چکیده

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.

کلیدواژه‌ها

Mirage effect؛ Non destructive method؛ Photothermal deflection PTD؛ Thermal conductivity؛ Porous Silicon؛ Electrochemical etching؛ Nano crystalline؛ Film