Investigations on structural and electrical properties of Cadmium Zinc Sulfide thin films

International Journal of Nano Dimension

مقاله 13، دوره 6، شماره 4، دی 2015، صفحه 433-438   

نوع مقاله: Reasearch Paper

شناسه دیجیتال (DOI): 10.7508/ijnd.2015.04.012

نویسندگان

S. Sagadevan^{* 1}؛ K. Pandurangan²

¹Department of Physics, Sree Sastha Institute of Engineering and Technology, Chembarambakkam, Chennai 600123, India.

²Department of Physics, Madha Engineering College, Kundrathur, Chennai, India.

چکیده

Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the morphology of Zn-CdS thin film. Optical studies have been carried out using UV-Visible-NIR transmission spectrum. The dielectric properties of Zn-CdS thin films have been studied in the different frequency at different temperatures. The AC conductivity study shows a normal dielectric behavior with frequency which reveals that the dispersion is due to the interfacial polarization.

کلیدواژه‌ها

Solar Cell؛ Cadmium Zinc Sulfide؛ XRD؛ SEM analysis؛ Dielectric constant and Dielectric loss

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